Flexible, automated diagnostic solutions to help people solve circuit card problems.
Working Towards a Shorter Design Cycle
The success of introducing a new product today is based
upon the ability of a company to predictably introduce
high quality products on schedule, at reduced investment and ahead of the competition. An important
imperative in this equation is a design cycle that decreases over time. This leads to a more flexible,
responsive and cost effective development process.
A key factor in decreasing a design cycle is containing the amount of time and effort necessary to
bring a new board on-line. This is directly related to the time it takes to verify that the board is
ready for full utilization in an application mode and when elusive problems occur they can be diagnosed and
debugged in a predictable fashion. Factors that influence this are:
Flexible Precision Probing
The ability to test dense, complex boards effectively has a direct relationship to development time.
Inaccurate probing can produce confusing results and also jeopardize the safety of the board. The cost,
and time to debug and produce traditional fixtures is also a factor in development time and cost.
Development teams today are successfully utilizing precision automated guided probing stations using
both vision and CAD based information to accurately identify a test point and reliably get accurate
measurement information. This flexible probing environment is repeatable and reusable for successive
projects with minimum reinvestment (i.e. new probing heads, adding new measurement devices, etc).
* Automated Probing Station
Recognizing problems early in the design process
To eliminate costly PCA redesign efforts, it is important to identify potential problems before initial
development or first production runs. The cost of discovering circuit problems once the design is out of
engineering is a minimum 10 fold over discovering and eliminating them while the design is still in
development.
* Effective circuit verification with an automated probing station
Low risk testing
Using Nondestructive Test methods is a low risk method to verify components on a board prior to
applying power and exposing circuitry to further damage or stress that may cause board failure.
* Nondestructive Testing
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Design/Test Engineering |
Manufacturing |
Repair |