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Flying Probe Platforms Automate Your Custom Test Application

Huntron Custom Prober Systems

Productivity Challenges of Manually Probing High Density Circuits

Vision, Dexterity and Distractions continually limit the effectiveness and reliability of diagnostic measurements. Technicians and engineers equipped with the most advanced test instruments still have to locate the test point, place the probe and take the measurement.

  • Vision Factor:
    High density circuit components are difficult to see and often require magnification devices.
  • Dexterity Factor:
    Measurement points can be small and close together. Accurate probe placement and repeatable measurements can be difficult.
  • Distraction Factor:
    Interruptions by telephones, coworkers, pages and meetings can take their toll on completing a test procedure.

Finding the Right Automation Solution to Meet Your Needs

Start by identifying the process that needs to be automated and then consider the requirements that will fix your problem. Define the accuracy, speed and number of test points you require then look at the robotic platform options available. Lastly, consider the price versus the cost savings in reduced test time, fewer misplaced probes and lower burden on engineering resources.

Basic Integrations

Automate your custom test process

Access Prober with Remote Control

  • Minimal time needed from Concept to Installation
  • Huntron Workstation runs in the background
  • Users can set up their own Test Executive control
  • Easy to set up, configure and control
  • Learn More >>

Integrations with Huntron Workstation

Automate Test Procedures

Access Prober with Workstation SDK

  • Completely integrated Test System with low development time
  • Your measurements are integrated into Workstation
  • Most complete turn-key solution
  • Requires vendor instrument drivers (DLL)
  • Learn More >>

Full Custom Integrations

Automation hardware

Access Prober with Hardware SDK

  • Design your Custom Test System using a proven robotic probing platform
  • Hardware SDK for creating custom applications
  • Tailor the application to your specific needs
  • DLLs and sample applications are supplied
  • Learn More >>

Flying Probe Technology - Automated Diagnostic Platforms

Huntron Access Probers have provided economical, automated single point (probe) diagnostics of densely packed surface-mount circuit cards assemblies (CCA) since the early 1990's. Surface mount technology has made the observation of constantly varying events a challenge when manual measurements are needed. Huntron Access Probing Stations open the measurement spectrum to fixtureless diagnostic robotic probing. Single or dual point systems provide accurate automation of one or two point measurements therefore reducing the manual dexterity limits when an event needs to be captured. Huntron Access Probing Stations can be configured to work with almost any standard measurement instrument such as Huntron Trackers, multimeters, oscilloscopes, spectrum analyzers...

Integrated Systems Comparison Chart

Integration Level Remote Control Workstation SDK Hardware SDK
Best Use Adding Prober automation to other test instrumentation Adding other test instrumention into Huntron Workstation Integrating Huntron Products into other systems
Level of programming required Minimal to Intermediate depending on existing software tools Minimal due to single DLL modification Extensive due to full application development
Supported programming languages VS2005 VB.NET or any langauge/test executive that can call a .NET DLL VS2005 VB.NET or any langauge that can create a .NET DLL VS2005 VB.NET or any langauge that can call a .NET DLL
Hardware Supported Huntron Trackers, Probers and other test instrumentation Other test instrumentation Huntron Probers and other test instrumentation
Huntron development services available? Yes Yes Yes
Huntron Workstation needed? Yes Yes No
Download Datasheet Remote Control datasheet Workstation SDK datasheet Hardware SDK datasheet

Replace Board Test Fixtures

Testing methods for low-volume and prototype circuit boards are becoming harder with the increasing complexity and density. Low-volume production runs or prototypes do not normally justify the cost of bed-of-nails in-circuit testing. The use of flying probe technology provides a cost-effective solution.

Imagine the Possibilties

The ability to automate a test procedure will yield results not only in productivity but accuracy and repeatability. What type of testing can be successfully automated? Read on...

  • Huntron Tracker Power-off
    In repair situations it is often necessary to test the board without power applied due to uncertainty as to the nature of the failure.
  • Near Field RF Measurements
    Eliminate manual sniffer probes methods by automating the placemnt of the RF probe with an Access Prober.
  • Point-to-point Component Measurements
    Accurately measure voltage, resistance, current, capacitance, inductance and differential measurements between two points on a printed circuit assembly.
  • Stimulus / Response Measurements (Fault Injection)
    Debug, fault injection, electrical transient monitoring and sustained engineering applications.
  • Boundary Scan
    Use of the probes as independent cells to increase test coverage of interconnects and clusters of logic, memories etc.
  • Guided Probe Measurements
    Physical contact, minimum impact on circuit operation, adequate signal fidelity, especially for high-density surface mount technology. Passive, active, differential, logic and current probes can be mounted.
  • Multiple Probe Arrays
    Add fixed probe arrays to access a number of points at one time. Maximum downforce is up to 5 lbs.
  • More???
    Custom integration of unique applications such as vision, infrared mapping, temperature sensing and mechanical manipulation.

General Specifications

Huntron currently manufactures three styles of Access Robotic Probers. More detailed information is available on the Access Probers web page.

  • Access Prober
    Low profile, single head prober with a smaller test bed area
  • Access 2 Prober
    Larger single head prober well suited to larger PCAs.
  • Access DH (Dual Head) Prober
    Open architecture, two head prober suited for point-to-point testing as well as many other functions