• Huntron Access DH2 Prober

    Flexibility, for electronic circuit card assembly diagnosis  MILL CREEK, Wash., July 24, 2018 — Huntron Inc. announced the addition of the Huntron Access DH2 (Dual Head) Open Architecture Probing Station, “The expertise Huntron gained with developing the original Access DH robotic prober has allowed us to help customers automate their custom test processes. The Access […]