{"id":144,"date":"2018-07-24T18:33:00","date_gmt":"2018-07-24T18:33:00","guid":{"rendered":"https:\/\/huntron.com\/news\/?p=144"},"modified":"2021-01-12T11:59:13","modified_gmt":"2021-01-12T19:59:13","slug":"huntron-access-dh2-dual-head-prober","status":"publish","type":"post","link":"https:\/\/huntron.com\/news\/huntron-access-dh2-dual-head-prober\/","title":{"rendered":"Huntron Access DH2 Prober"},"content":{"rendered":"\n<div class=\"wp-block-image\"><figure class=\"alignright size-large is-resized\"><img loading=\"lazy\" decoding=\"async\" src=\"https:\/\/huntron.com\/products\/images\/DH2-face-left.jpg\" alt=\"Access DH2 Prober\" width=\"250\" height=\"275\"\/><figcaption>Access DH2 Robotic Prober<\/figcaption><\/figure><\/div>\n\n\n\n<p><em>Flexibility, for electronic circuit card assembly diagnosis&nbsp;<\/em><\/p>\n\n\n\n<p>MILL CREEK, Wash., July 24, 2018 &#8212; Huntron Inc. announced the addition of the <a href=\"https:\/\/huntron.com\/products\/accessdh2.htm\">Huntron Access DH2 (Dual Head) Open Architecture Probing Station<\/a>, \u201cThe expertise Huntron gained with developing the original Access DH robotic prober has allowed us to help customers automate their custom test processes. The Access DH2 is refinement based on customer feedback and our own experience.\u201d said Brad Grams, President at Huntron Inc.\u00a0<\/p>\n\n\n\n<h2 class=\"has-medium-font-size wp-block-heading\"><strong>Ensuring Test Flexibility<\/strong><\/h2>\n\n\n\n<p>The Access DH2 Prober is a dual head Robotic Flying Probe system that is best suited for low volume printed circuit assembly (PCA) testing where interfacing between two points is necessary. It can be used with traditional Huntron Tracker products or configured to work with Functional and Parametric test and measurement instruments. The Access DH2 built-in side by side 19&#8243; racks provide plenty of space for PC and integrated test instrumentation giving you a plug and play approach to automating manual guided probe applications.<\/p>\n\n\n\n<p>The Huntron Access DH2 provides clear path to increased productivity and printed circuit card asset recovery ensuring a cost effective approach to shorten repair cycles and enhance conventional test procedures. The benefits are recovery of previously unrepairable PCAs, support of legacy products that have limited or no documentation and diagnosing fallout from functional test.&nbsp;<\/p>\n","protected":false},"excerpt":{"rendered":"<p>Flexibility, for electronic circuit card assembly diagnosis&nbsp; MILL CREEK, Wash., July 24, 2018 &#8212; Huntron Inc. announced the addition of the Huntron Access DH2 (Dual Head) Open Architecture Probing Station, \u201cThe expertise Huntron gained with developing the original Access DH robotic prober has allowed us to help customers automate their custom test processes. The Access [&hellip;]<\/p>\n","protected":false},"author":1,"featured_media":0,"comment_status":"open","ping_status":"open","sticky":false,"template":"","format":"standard","meta":{"footnotes":""},"categories":[2],"tags":[],"class_list":["post-144","post","type-post","status-publish","format-standard","hentry","category-product-news"],"yoast_head":"<!-- This site is optimized with the Yoast SEO plugin v24.7 - https:\/\/yoast.com\/wordpress\/plugins\/seo\/ -->\n<title>Huntron Access DH2 Prober - Huntron News and Information<\/title>\n<meta name=\"description\" content=\"The Huntron Access DH2 Prober is the second generation dual head robotic test station used to automate test processes.\" \/>\n<meta name=\"robots\" content=\"index, follow, max-snippet:-1, max-image-preview:large, max-video-preview:-1\" \/>\n<link rel=\"canonical\" href=\"https:\/\/huntron.com\/news\/huntron-access-dh2-dual-head-prober\/\" \/>\n<meta property=\"og:locale\" content=\"en_US\" \/>\n<meta property=\"og:type\" content=\"article\" \/>\n<meta property=\"og:title\" content=\"Huntron Access DH2 Prober - 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