Flexible, automated diagnostic solutions to help people solve circuit card problems.
Metrikos Near Field Signature Analysis
Robotic Technology for Automated RF and Microwave Diagnostics
Near Field Signature Analysis (NFSA - patent pending) is close proximity sensing of EM fields emanating from active or passive circuitry. Near Fields are close to active circuits with the strength dependant on power and circuit design. A specific position in a Near Field can be considered a Virtual Test Point™ where a measurement can be made. Identical circuits emanate nearly identical fields at the same point. AC circuits radiate a unique frequency and magnitude “signature” with the “signature” being a function of frequency of operation, distance to the test probe and geometric location of the probe.
Active RF Circuit Proof of Concept
Using the Near Field Signature Analysis system on an active microwave circuit shows that the Near Fields of simple MMIC amplifier circuit can be mapped and overlayed on a real circuit image. The baseline signatures were first obtained at nominal bias.
Near Field Signal Measurements - Baseline (left) and Reduced Gain (right).
Fault Detection Maps - Map (left) and Map with Circuit image background (right).
Near Field Signature Analysis Benefits
- Non-contact Diagnostic Fault Location in RF Circuits
- Examine PCB Status (Good or Bad) prior to Coating Removal
- Significantly Reduced operator intervention
- Repeatable high frequency in-vitro measurements
- New Product Characterization and Production Testing
For more information on Near Field Signature Analysis from Metrikos, Inc., download the Near Field Signature Analysis datasheet or contact Huntron directly.